Color online a XRD-2 scans of epitaxial Ni-Ti/MgO001
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Development of in situ characterization techniques in molecular beam epitaxy
Perspectives on oblique angle deposition of thin films: From fundamentals to devices – topic of research paper in Nano-technology. Download scholarly article PDF and read for free on CyberLeninka open science hub.
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laboratory 1
Color online) XRD x-2h scans from epitaxial W(001)/MgO(001) layers
Development of in situ characterization techniques in molecular beam epitaxy
Crystal Orientation-Dependent Oxidation of Epitaxial TiN Films with Tunable Plasmonics
Color online a XRD-2 scans of epitaxial Ni-Ti/MgO001 heterostructures
Heteroepitaxial growth of TiN film on MgO (100) by reactive magnetron sputtering
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